Operational Field Coupled ESD Susceptibility of Magnetic Sensor IC’s in Automotive Applications. SPECIAL MEETING LOCATION: UL NOVI

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IEEE Southeastern Michigan: Chapter VIII (EMC)

Southeastern Michigan IEEE EMC Chapter technical meeting.



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  Date and Time

  Location

  Contact

  Registration


  • 25175 Regency Dr
  • Novi, Michigan
  • United States 48375
  • Building: Underwriters Laboratories

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  • Registration closed


  Speakers

Cyrous Rostamzadah

Cyrous Rostamzadah

Topic:

Operational Field Coupled ESD Susceptibility of Magnetic Sensor IC’s in Automotive Applications

Modern automobiles feature more than 80 applications that rely on magnetic sensors. Magnetic or hall-effect sensor ICs are extremely temperature-stable and stress resistant devices especially suited for operating over extended temperature ranges to 150oC ideal for harsh automotive environment. More than 2 billion hall-effect sensors are manufactured annually for automotive applications. Hall-effect sensors are integral part of safety, power train, and body electronics. The potential for magnetic sensor IC damage when exposed to Operating Field Coupled Electrostatic Discharge is of key interest. Continuous trends in IC industry (shrinking geometries), and wire-bond transitioning from gold to copper (15 m) may decrease the reliability and increase the failure rate. Coupling fields as a result of ESD discharge may induce large currents and voltages subsequently leading to physical damage in sub-miniaturized IC’s.

Biography: Cyrous Rostamzadeh is currently an EMC Technical Specialist at Robert Bosch LLC, Plymouth – Michigan, where he has implemented an EMC design and analysis process to facilitate product compliance at the lower cost. Since 1997 at Bosch, he is engaged in PCB and system level EMC robustness techniques and solutions. He is responsible to provide product design support and EMC interface to NA, Asian and European automotive market. During the past 17 years at Bosch, he has played key role in the design, development of EMC and signal integrity solutions for global Bosch market.
Prior to joining Bosch, he was a senior EMC engineer at Ford Motor Company. His extensive research on load dump transient event resulted in identification of realistic waveform. His research has shaped the revised US EMC automotive standards. He was a core member of Ford EMC design and test process methodology team. In addition to Ford, he was a senior EMC engineer at General Motors Corporation. From 1989 – 1994 he was a senior electrical engineer at Superconducting Super Collider Laboratory (SSCL) Dallas, Texas. He was responsible for development and design of quench protection and detection electronics for superconducting magnets. He was also employed at National Semiconductor as analog engineer. He spent 3 years at Grunding Corporation as RF engineer.
Cyrous received a B.Sc. (Hon.), M.Sc. in Physics and MSEE in Electrical Engineering from Imperial College of Science and Technology, University of London (UK). He is an associate of the Royal College of Science (UK). He participated at MIT during the summer of 1990 on the design and development of High Power SSCL Quench Bypass Switch. He received Particle Accelerator Physics training at Stanford University (1992). He is a senior IEEE member, NARTE certified EMC and Product Safety Engineer. He is an active member of IEEE EMC TC-9 Computational Electromagnetics committee. He has given numerous EMC seminars and training courses to Bosch engineering associates, IEEE SE Michigan EMC Chapter, universities and international EMC organizations. He has published extensively at IEEE EMC, IEEE PAC, URSI-GA and ASEE symposium. Cyrous was an invited guest speaker at European Space Agency (ESA) Florence, Italy - March 2009.

Email:

Address:Michigan, United States

Cyrous Rostamzadah

Topic:

Operational Field Coupled ESD Susceptibility of Magnetic Sensor IC’s in Automotive Applications

Biography:

Email:

Address:Michigan, United States





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