Impact of Mismatch Error on Mobile Phone Simulation for Automotive EMC Testing


IEEE Southeastern Michigan: Chapter VIII (EMC)

Southeastern Michigan IEEE EMC Chapter technical meeting.

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  • 19000 Hubbard Drive
  • Dearborn, Michigan
  • United States 48126
  • Building: University of Michigan - Dearborn Fairlane Center South
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Keith Frazier

Keith Frazier of Ford


Automotive electronic systems must operate as designed while exposed to the RF energy produced by mobile transmitters including cellular telephones.  Automotive OEMs often verify functional performance using test procedures delineated in ISO 11452-3 [1] and ISO 11452-9 [2].   Test procedures simulate the mobile device via use of a small antenna placed in close proximity to the electronic device.  RF immunity levels are based on a specified net power delivered from a broadband amplifier attached to the antenna via coaxial cable.  The ISO standard makes only cursory reference to minimizing the antenna VSWR and cable loss for accurate delivery of the specified net power.  This paper will focus on the effect of mismatch loss and its specific impact on the error in the actual net power delivered to the antenna.



Keith Frazier

Ford Motor Company

Keith Frazier received his BS in electrical engineering from Purdue University in 1976.  He has been a practicing EMC engineer for over 38 years with experience in automotive, military, aerospace and commercial electronics with emphasis on system design and testing with respect to EMI and Tempest disciplines.  Keith joined Ford Motor Company in 1990 and serves as Ford’s technical leader responsible EMC systems design for Ford automotive products and in addition to development of global EMC requirements and test methods.  He is also an active member of the US Technical Advisory Group supporting ISO and CISPR automotive standard development.  


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Keith Frazier of Ford



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