Ultra-Low Power Design and RF Circuit Reliability for Internet of Things (IoT)

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Wearable electronics, intelligent devices, medical electronics, and more recently internet of things (IoT) are dramatically changing the way we experience life by providing rich information about our activities, health, and the environment. To be truly ubiquitous, these devices must be energy autonomous and ultra-low power using the little energy available to it for computation. In addition, RF circuit reliability for wireless communication becomes increasingly important for IoT devices.

Professor Yuan is going to present research topics in ultra-low power mixed-signal ADC designs using emerging tunnel FET devices. Energy autonomous electronics using RF energy harvesting and wireless power transfer will be illustrated. In addition, RF circuit reliability subjected to hot electron and gate oxide breakdown stress and process variability will be presented.



  Date and Time

  Location

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  • 82 Running Hill Road
  • South Portland, Maine
  • United States 04106
  • Building: Fairchild Semiconductor
  • Room Number: Robert Noyce (RHR-153)
  • Click here for Map

Staticmap?size=250x200&sensor=false&zoom=14&markers=43.6362401%2c 70
  • Jifa Hao : jifa.hao@fairchildsemi.com

  • Co-sponsored by Alister Young
  • Starts 01 August 2016 10:00 AM
  • Ends 11 August 2016 11:00 AM
  • All times are US/Eastern
  • No Admission Charge
  • Register


  Speakers

Dr. Jiann-Shiun Yuan
Dr. Jiann-Shiun Yuan

Topic:

Ultra-Low Power Design and RF Circuit Reliability for Internet of Things (IoT)

Wearable electronics, intelligent devices, medical electronics, and more recently internet of things (IoT) are dramatically changing the way we experience life by providing rich information about our activities, health, and the environment. To be truly ubiquitous, these devices must be energy autonomous and ultra-low power using the little energy available to it for computation. In addition, RF circuit reliability for wireless communication becomes increasingly important for IoT devices.


Professor Yuan is going to present research topics in ultra-low power mixed-signal ADC designs using emerging tunnel FET devices. Energy autonomous electronics using RF energy harvesting and wireless power transfer will be illustrated. In addition, RF circuit reliability subjected to hot electron and gate oxide breakdown stress and process variability will be presented.

Biography:

Jiann-Shiun Yuanreceived the M.S. and Ph.D. degrees from the University of Florida, Gainesville, in 1984 and 1988, respectively. In 1988 and 1989 he was with Texas Instruments Incorporated for CMOS DRAM design. Since 1990 he has been with the faculty of the University of Central Florida (UCF), Orlando, where he is currently a full Professor and Director of NSF Multi-functional Integrated System Technology (MIST) Center. He is the author of three textbooks and 300 papers in journals and conference proceedings. He supervised twenty-three Ph.D. dissertations, thirty-two M.S. theses, and five Honors in the Major theses at UCF. Since 1990, he has been conducting many research projects funded by the National Science Foundation, Intersil, Jabil, Honeywell, Northrop Grumman, Motorola, Harris, Lucent Technologies, National Semiconductor, and state of Florida. He is currently supervising six Ph.D. students and one master student for research.

Dr. Yuan is a member of Eta Kappa Nu and Tau Beta Pi. He is a founding Editor of the IEEE Transactions on Device and Materials Reliability and a Distinguished Lecturer for the IEEE Electron Devices Society. He was the recipient of the 1995, 2004, 2010, and 2015 Teaching Award, UCF; the 2003 Research Award, UCF; the 2003 Outstanding Engineering Award, IEEE Orlando Section, the Excellence in Research Award at the full Professor level of the College of Engineering and Computer Science in 2015, and the Pegasus Professor Award, highest academic honor of excellence at UCF, in 2016.

Email:

Address:Professor of College of Engr And Computer Science Dept, University of Central Florida, Orlando, United States, 32816

Dr. Jiann-Shiun Yuan

Topic:

Ultra-Low Power Design and RF Circuit Reliability for Internet of Things (IoT)

Biography:

Email:

Address:Orlando, United States





Agenda

5:30PM - 6:15PM Social/Dinner

6:15PM - 6:30PM IEEE Business

6:30PM - 8:00PM Lecture/Q&A